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semi-automatic test equipment

См. также в других словарях:

  • Automatic test equipment — Automatic/automated test equipment (ATE) is any automated device that is used to quickly test printed circuit boards, integrated circuits, or any other related electronic components or modules. Nowadays, ATE devices are essentially always… …   Wikipedia

  • Automatic transmission — An automatic transmission (commonly AT or Auto ) is an automobile gearbox that can change gear ratios automatically as the vehicle moves, freeing the driver from having to shift gears manually. Similar but larger devices are also used for heavy… …   Wikipedia

  • Military equipment of Turkey — The military equipment of Turkey includes a wide array of arms, artilleries, large surface vessels, cannons, armored vehicles, mortars, unmanned vehicles and many different equipments. Contents 1 Historical development 1.1 General 1.2 1923 1950 …   Wikipedia

  • Automatic summarization — is the creation of a shortened version of a text by a computer program. The product of this procedure still contains the most important points of the original text. The phenomenon of information overload has meant that access to coherent and… …   Wikipedia

  • Digital Equipment Corporation — Industry Computer manufacturing Fate Assets were sold to various companies. What remained was sold to Compaq. Successor …   Wikipedia

  • List of IEC standards — In order to distinguish standards published by the International Electrotechnical Commission numerically from other international standards, their number range was shifted in 1997 by adding 60000. So what used to be called IEC 27 is now… …   Wikipedia

  • CAC/PAC JF-17 Thunder — JF 17 Thunder FC 1 Xiaolong …   Wikipedia

  • Integrated Logistics Support — (ILS) is a technique introduced by the US Army to ensure that the supportability of an equipment is considered during its design and development. The technique was adopted by the UK MOD in 1993 and made compulsory for the procurement of the… …   Wikipedia

  • Focal plane array testing — (under development sep 15)Focal Plane Array testing (FPA testing) is the test engineering process of validation and verification (V V) of operation of focal plane array imaging devices, device under test (DUT), at various levels of the… …   Wikipedia

  • Mikroelektronik — Die Mikroelektronik ist ein Teilgebiet der Elektronik, genauer der Halbleiterelektronik. Die Mikroelektronik beschäftigt sich mit dem Entwurf, der Entwicklung und der Herstellung von miniaturisierten, elektronischen Schaltungen, heute vor allem… …   Deutsch Wikipedia

  • George Chamillard — is an American business executive most famous for his roles at Teradyne, a manufacturer of automatic test equipment for semiconductor devices.Rising through the ranks at Teradyne over his more than 35 years there, Chamillard eventually headed the …   Wikipedia

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